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Removal of particles from wafer stage using wafer-formed cleaning material (cleaning wafer)

机译:使用晶片形成的清洁材料(清洁晶片)去除晶片台上的颗粒

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As a method of removing particles from a wafer stage. The use of a wafer-shaped cleaning material (hereafter, Cleaning Wafer) was considered for removal of the particles. One concern in using a Cleaning Wafer was that it might be caught in the wafer transfer system; such a failure can be prevented by adjusting the viscoelasticity parameters of the cleaning layer. The other concern was that the Cleaning Wafer might contaminate the wafer stage. The viscoelasticity cleaning layer is designed to produce less contamination. Consequently, by using a Cleaning Wafer, the amount of labor required for wafer cleaning can be decreased significantly.
机译:作为从晶片阶段移除颗粒的方法。考虑使用晶片形清洁材料(下文,清洁晶片)以除去颗粒。使用清洁晶片的一个问题是它可能陷入晶片转移系统中;通过调节清洁层的粘弹性参数,可以防止这种失败。其他问题是清洁晶片可能污染晶片阶段。粘弹性清洁层设计成产生较少的污染。因此,通过使用清洁晶片,可以显着降低晶片清洁所需的劳动量。

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