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A 0.15 /spl mu/m CMOS foundry technology with 0.1 /spl mu/m devices for high performance applications

机译:0.15 / spl mu / m CMOS铸造技术和0.1 / spl mu / m器件,用于高性能应用

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This paper describes a leading-edge 0.15 /spl mu/m CMOS logic foundry technology family. Advanced core devices using 20 /spl Aring/ oxides for 1.2-1.5 V operation (L/sub G min/=0.1 /spl mu/m) support high-performance CPU and graphics applications. The technology supports also low-standby power applications with 26 /spl Aring/ oxide for 1.5 V operation. Periphery circuitry for 2.5 or 3.3 V compatibility use dual 50 or 65 /spl Aring/ gate oxides respectively. AlCu with low-k (FSG) is used for the seven-level metal interconnect system with extremely tight pitch (0.39 /spl mu/m for M1 and 0.48 /spl mu/m for intermediate levels). The aggressive design rules and border-less contacts/vias render an embedded (synchronous cache) 6T SRAM cell of 3.42 /spl mu/m/sup 2/ demonstrated in a 2Mb vehicle with very high yield. The overall process reliability is also shown to meet standard industry requirements.
机译:本文介绍了领先的0.15 / spl mu / m CMOS逻辑铸造技术系列。使用20 / spl Aring /氧化物进行1.2-1.5 V操作(L / sub G min / = 0.1 / spl mu / m)的高级核心设备支持高性能CPU和图形应用程序。该技术还支持低待机功率应用,其工作电压为26 / spl Aring /氧化物,工作电压为1.5V。兼容2.5或3.3 V的外围电路分别使用两个50或65 / spl Aring /栅氧化层。具有低介电常数的AlCu(FSG)用于间距极小的七级金属互连系统(M1为0.39 / spl mu / m,中级为0.48 / spl mu / m)。激进的设计规则和无边界的接触/过孔使得在2Mb车辆中展示出的嵌入式(同步缓存)3.42 / spl mu / m / sup 2 /的6T SRAM单元具有很高的良率。整个过程的可靠性也被证明可以满足标准的行业要求。

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