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Fabrication technology for wafer through-hole interconnections and three-dimensional stacks of chips and wafers

机译:晶圆通孔互连以及芯片和晶圆的三维堆叠的制造技术

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This paper presents an approach to build electronic systems with very high chip count. Instead of packing the chips laterally as it is done in multichip-modules (MCMs), individual dies, blocks of dies and ultimately entire wafers are stacked on top of each other. Electrical interconnection is accomplished using plated through-hole contacts through the silicon substrate. Proper thermal management is obtained using dedicated heat distribution contacts, which can be fabricated by a judiciously designed mask layout and without additional processing effort. Thermally induced stress in the interconnections between the stacked layers is limited both by means of design and process variations.
机译:本文提出了一种构建具有很高芯片数的电子系统的方法。与其像在多芯片模块(MCM)中那样横向封装芯片,不如将单个管芯,管芯块以及最终整个晶片堆叠在一起。使用穿过硅基板的镀通孔触点可以实现电互连。使用专用的热分配触点可获得适当的热管理,该触点可以通过明智设计的掩模布局来制造,而无需额外的处理工作。堆叠层之间的互连中的热诱导应力通过设计和工艺变化两者来限制。

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