Elevated temperature measurements of permittivity and permeability at temperatures above 1000 degrees C

摘要

A system to measure complex electromagnetic constitutive parameters to temperatures of 2000 degrees C has been successfully designed and constructed. The facility is based on a reflectometer measurement using a Hewlett Packard 8510B as a receiver and a circular graphite transmission line. A calibration short (external to the heated transmission line) is to improve calibration of the reflection coefficient. Parameters can be measured from 7.5 to 40 GHz. The authors present a design of the system and a discussion of the measurement procedure used to obtain the high-temperature data. Measurements of commercial ceramics are presented for comparison to other techniques.