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Decay mechanisms of passive matrix organic light-emitting diode display

机译:无源矩阵有机发光二极管显示器的衰减机理

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A 102X64 monochromatic passive matrix organic light-emitting diode (PMOLED) display was studied for its decay process. The structure of the device was ITO(indium tin oxide )/CuPc (copper phthalocyanine/NPB(N,N'-di(naphthalene-l-yl)-N,N'-diphenyl-benzidine)/Alq_3(tris-(8hydroxyqu-inoli ne)aluminum):C545(coumarin)/Alq_3/LiF/Al. We carried out a vision inspection and electrical (I-V) and optical characterizations, analyzed the EL (electroluminescence) and PL (photoluminescence) spectra before and after the aging test. The aged device under constant current appeared higher driving voltage, smaller leak current, lower EL and PL intensities which were come from the peeling of cathode/organic layers, the burning of shorted routes between the electrodes and the decomposition of light-emitting materials. The EL intensity remains 75.6% while the PL does 81.4% of their initials values after 17 hours aging, which means the EL and PL decay simultaneously, i.e. the decomposition of emissive material is dominant in the decay process and results in the permanent damage in the display panel.
机译:研究了一种102X64单色无源矩阵有机发光二极管(PMOLED)显示器的衰减过程。该装置的结构为ITO(氧化铟锡)/ CuPc(铜酞菁/ NPB(N,N'-二(萘-1-基)-N,N'-二苯基联苯胺)/ Alq_3(三-(8-羟基-inoli ne(铝):C545(香豆素)/ Alq_3 / LiF / Al。我们进行了外观检查以及电学(IV)和光学表征,分析了老化前后的EL(电致发光)和PL(光致发光)光谱测试:在恒定电流下老化的器件表现出较高的驱动电压,较小的泄漏电流,较低的EL和PL强度,这是由于阴极/有机层的剥离,电极之间的短路路径的燃烧以及发光材料的分解引起的。老化17小时后,EL强度保持75.6%,而PL达到其初始值的81.4%,这意味着EL和PL同时衰减,即发光材料的分解在衰减过程中占主导地位,并导致永久损坏。显示面板。

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