首页> 外文会议>International Conference on Electroceramics and their Applications, Montreux, Switzerland, 24-27 August 1998 >Structural and surface morphology characterizations of oriented LiNbO_3 thin films grown by polymeric precursor method
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Structural and surface morphology characterizations of oriented LiNbO_3 thin films grown by polymeric precursor method

机译:高分子前驱体法制备取向的LiNbO_3薄膜的结构和表面形态表征

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摘要

Polymeric precursor solution was used to deposit LiNbO_3 thin films by dip coating on sapphire substrates. The effects of processing variables, such as heat treatment conditions and number of deposited layers, on crystallinity and morphology of the final films were investigated. X-ray diffraction patterns show the oriented growth of the films. The rocking curves, obtained around the (006) LiNbO_3 peak, revealed that the shape peak and the FWHM value were influenced by the processing variables. According to these parameters, some films presented very homogeneous dense and smooth surfaces, as shown by the SEM and AFM studies.
机译:聚合前体溶液用于通过浸涂在蓝宝石衬底上沉积LiNbO_3薄膜。研究了加工变量(例如热处理条件和沉积层数)对最终膜的结晶度和形态的影响。 X射线衍射图显示了膜的定向生长。在(006)LiNbO_3峰附近获得的摇摆曲线表明,形状峰和FWHM值受加工变量的影响。根据这些参数,某些薄膜呈现出非常均匀的致密和光滑表面,如SEM和AFM研究所示。

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