首页> 外文会议>International Test Conference >Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

【24h】

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

机译：应用Vstress和缺陷激活覆盖范围来生产零缺陷混合信号汽车IC

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

The test and design methodology currently used to develop automotive mixed-signal integrated circuits, is not sufficient to achieve the 展开

机译：当前用于开发汽车混合信号集成电路的测试和设计方法不足以实现扩展

著录项

来源
《International Test Conference》|2019年|1-4|共4页
会议地点 Washington(US)
作者
Wim Dobbelaere; Frederik Colle; Anthony Coyette; Ronny Vanhooren; Nektar Xama; Jhon Gomez; Georges Gielen;
展开▼
作者单位

ON Semiconductor Oudenaarde Belgium;

KU Leuven Department of Electrical Engineering Leuven Belgium;

KU Leuven Department of Electrical Engineering Le;

展开▼
会议组织
原文格式 PDF
正文语种
中图分类
关键词
automotive electronics; mixed analogue-digital integrated circuits;

机译：汽车电子；混合模数集成电路;

相似文献

外文文献
中文文献
专利

1. Zero-defect software: The elusive goal: It is theoretically possible but difficult to achieve; logic and interface errors are most common, but errors in user intent may also occur [J] . Hamilton M.H. IEEE Spectrum . 1986,第3期

机译：零缺陷软件：难以实现的目标：理论上可行，但难以实现；逻辑和接口错误是最常见的，但也可能发生用户意图错误
2. Disruptive data visualization towards zero-defects diagnostics [J] . Luís Ferreira, Goran D. Putnik, Nuno Lopes, Procedia CIRP . 2018,第5aPartaA期

机译：恢复缺陷诊断的破坏性数据可视化
3. Identification of Critical Key Parameters and their Impact to Zero-defect Manufacturing in the Investment Casting Process [J] . M. Di Foggia, D.M. D’Addona Procedia CIRP . 2013,第5期

机译：精铸过程中关键关键参数的识别及其对零缺陷制造的影响
4. Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs [C] . Wim Dobbelaere, Frederik Colle, Anthony Coyette, International Test Conference . 2019

机译：应用Vstress和缺陷激活覆盖，产生零缺陷混合信号汽车IC
5. Behavioral modeling and simulations of mixed-signal integrated circuits with process variations and physical defects. [D] . Guo, Yu-Yau. 2003

机译：具有过程变化和物理缺陷的混合信号集成电路的行为建模和仿真。
6. A Mixed-Signal VLSI System for Producing Temporally Adapting Intraspinal Microstimulation Patterns for Locomotion [O] . Kevin A. Mazurek, Bradley J. Holinski, Dirk G. Everaert, -1

机译：混合信号VLSI系统用于产生临时适应运动的脊柱内微刺激模式
7. Identification of Critical Key Parameters and their Impact to Zero-defect Manufacturing in the Investment Casting Process [O] . Di Foggia, M., D'Addona, D.M. 2013

机译：关键关键参数的识别及其对熔模铸造过程中零缺陷制造的影响

Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs

摘要

著录项

相似文献

相关主题

期刊订阅