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Asian Test Symposium - Past, Present and Future -

机译:亚洲测试研讨会-过去,现在和未来-

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摘要

The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind. ATS has been annually held for 27 years at 23 cities (four cities, Beijing, Shanghai, Hiroshima, and Taipei hosted ATS twice). Fig. 1 shows the venues of ATS including three coming ATS. During these years, ATS has been provided the opportunity to deeply discuss test technology and enhance networking in the research and geographical regions. ATS will continuously play this role in the future.
机译:亚洲测试研讨会(ATS)为来自世界各国(尤其是亚洲)的工程师和研究人员提供了一个国际论坛,以考虑到设计,制造和现场考虑,介绍和讨论设备,电路板和系统测试的各个方面。 ATS每年在23个城市举行27年(北京,上海,广岛和台北四个城市两次举办ATS)。图1显示了包括三个即将到来的ATS的ATS场所。在这些年中,ATS提供了深入讨论测试技术并加强研究和地理区域网络的机会。 ATS在未来将继续扮演这一角色。

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  • 会议地点 Washington(US)
  • 作者单位

    Graduate School of Science and Technology Nara Institute of Science and Technology Japan;

    Institute of Computing Technology Chinese Academy of Sciences Beijing China;

    National Tsing Hua University Department of Electrical Engineering Hsinchu Taiwan;

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