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Surface morphology and structure study of titanium dioxide thin films deposited on PET substrates

机译:PET基底上沉积的二氧化钛薄膜的表面形态和结构研究

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Titanium dioxide (TiO2) thin films were deposited by rf magnetron sputtering, using a Ti target (purity 99.99%), on poly (ethylene terephthalate) (PET) substrate. Argon and oxygen were used as the working and reacting gas, respectively. The surface morphology was studied using scanning electron microscopy (SEM) and atomic force microscopy (AFM), and the film composition and structure by X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). Uniform and compact TiO2 nanoparticles with diameter about 50 nm were deposited on PET substrates within 2 minutes. Many nano-sized particles aggregated and formed larger clusters after 5 minutes. The size of the clusters increased with increased sputtering time. The particles grew perpendicular to the substrate, and the surfaces of the films were smooth and undulate. The Ti2p peak was resolvable into the three valence species Ti4+, Ti3+ and Ti2+. The O/Ti ratio varied with the Ar: O2, ratio, the optimum value of which was in the range 4-8. The TiO2 films deposited on PET substrate were amorphous.
机译:使用Ti靶(纯度为99.99%)通过射频磁控溅射将二氧化钛(TiO2)薄膜沉积在聚对苯二甲酸乙二酯(PET)衬底上。氩气和氧气分别用作工作气体和反应气体。使用扫描电子显微镜(SEM)和原子力显微镜(AFM)研究了表面形态,并通过X射线光电子能谱(XPS)和X射线衍射(XRD)研究了膜的组成和结构。在2分钟内将直径约50 nm的均匀且致密的TiO2纳米颗粒沉积在PET基板上。 5分钟后,许多纳米级颗粒聚集并形成较大的团簇。簇的尺寸随着溅射时间的增加而增加。颗粒垂直于基底生长,并且膜的表面光滑且起伏。 Ti2p峰可拆分为三个价种Ti4 +,Ti3 +和Ti2 +。 O / Ti比随Ar:O2的比而变化,其最佳值在4-8的范围内。沉积在PET基材上的TiO2薄膜是非晶态的。

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