Applications of Cryo-Analytical Electron Microscopy for Characterization of AgX-Based Photographic Systems and Their Microcomponents

摘要

The performance of photographic materials, which may be composed of 4-18 photosensitive layers and supplementary interlayers of several microns in thickness, where up to 100 various components are distributed in a gelatin matrix, depends on numerous controlled and uncontrolled factors . Admixtures and interactions in thin layers and at interfaces are of decisive importance for formation of the specified sensitometric, structure-sharpness, and color characteristics. As the materials become increasingly sophisticated, their comprehensive structural characterization is more desirable. The optimal strategy for the diagnosis of photographic systems by cryo-AEM assumes task oriented co-ordination in imaging, diffraction and spectroscopic modes taking into account electron-beam interactions within the systems and individual components, signal/image processing, separation and sample preparation techniques, etc. AgX research, however, is hampered by its high liability to decompose under probing irradiation, so cryo-cooling is required. This paper overviews studies of AgX-based photographic systems and their components by high spatial resolution cryo-energy-filtering transmission EM (EFTEM)/electron energy-loss spectroscopy (EELS)/ (field-emission) scanning TEM ((FE) STEM)/energy-dispersive X-ray (EDX) analysis, which may offer new possibilities as compared to conventional techniques.