On the Scalability of Redundancy based SER Mitigation Schemes

摘要

A novel circuit-level simulation strategy to assess the impact of charge sharing on the upset rate of redundancy based radiation hardened designs is introduced. Accelerated measurements conducted at the Los Alamos National Laboratory show a 10x or better reliability of hardened latches over standard latches for 45nm and 90nm implementations. Despite this encouraging trend, our simulations project that compact redundancy hardened designs will have soft error rates similar to non-hardened designs within a few technology generations if no additional mitigation techniques are applied to reduce the impact of charge sharing.