State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;
State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;
State Key Laboratory of Silicon Materials and Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;
oxygen precipitation; nitrogen; czochralski silicon; rapid thermal annealing; silicon nitride film;
机译:氮增强了覆盖氮化硅膜的切克劳斯基硅片中的氧沉淀
机译:氮掺杂的切克劳斯基硅片中的氧沉淀。二。氮氧耦合的影响
机译:氮掺杂的切克劳斯基硅片中的氧沉淀。一,近地表缺陷和整体缺陷的形成机理
机译:在氮化硅膜涂覆的Czochralski硅晶片中的氮素增强氧气沉淀
机译:切克劳斯基硅中氧沉淀的模型。
机译:嵌入氮化硅薄膜中的硅量子点与金纳米粒子在发光器件中的耦合增强了电致发光
机译:氮化硅涂覆的硅薄膜作为锂离子电池的阳极