QUANTITATIVE ANALYIS OF LOCAL SERIAL RESISTANCE AND DIODE LOSSES USING THE CELLO TECHNIQUE

摘要

The CELLO (solar CEL1 LOcal characterization) technique is briefly described and demonstrated, in particular with respect to the voltage response map and their causal relation to series resistances. A suitable model for a solar cell allowing fully analytical calculations of the interrelation of local voltage response and series resistances is introduced and discussed. The analytical results are used to derive a simple algorithm that allows to extract local resistance data in a fully quantitative form from measured voltage response data. Using this technique in combination with present hard- and software CELLO implementations produces fully quantitative resistance maps with sufficient spatial resolution within a few seconds.