首页> 外文会议>European microelectronics and packaging conference exhibition >INVESTIGATIONS OF MATERIALS AND MODELLING OF SENSITIVITY OF THICK-FILM RESISTORS ON DIFFERENT SUBSTRATES FOR STRAIN-GAUGE APPLICATIONS
【24h】

INVESTIGATIONS OF MATERIALS AND MODELLING OF SENSITIVITY OF THICK-FILM RESISTORS ON DIFFERENT SUBSTRATES FOR STRAIN-GAUGE APPLICATIONS

机译:应变规应用中不同基材上厚膜电阻器的材料研究和灵敏度建模

获取原文

摘要

This paper presents the results of an investigation into the characteristics of thick-film strain-gauges on alumina, zirconia,and LTCC substrates. These characteristics, which are used in analytical calculation and numerical modelling of the thickfilmresistors used in strain-gauge applications, are evaluated. The materials' compatibility and the significantcharacteristics (sheet resistivity, TCR, noise and GF) of selected 10 kΩ/sq. thick-film resistor materials were investigated.The resistors were printed and fired on different substrates: alumina, LTCC, and tetragonal zirconia substrates. Theexperimental results showed that the substrate has an important influence on the characteristics of the thick-film straingauges, not only because of chemical and microstructural interactions in the materials, but also because of the thermomechanicaland mechanical properties of both substrate and resistor. On the other hand, the construction of thick-film straingauges defines the sensitivity of the application. Finite-element analysis (FEA) was used as a method to improve theconstruction. To apply the appropriate characteristics in upcoming designs of different applications (load sensor, pressuresensor, etc) of thick-film strain gauges a simulation FEM (finite-element method) model was developed.
机译:本文介绍了对氧化铝,氧化锆和LTCC基板上的厚膜应变计特性进行研究的结果。评估了这些特性,这些特性用于应变计应用中的厚膜电阻的分析计算和数值建模。所选的10kΩ/ sq材料的相容性和显着特性(薄层电阻率,TCR,噪声和GF)。对电阻器进行了研究,然后将电阻器印刷并烧制在不同的基材上:氧化铝,LTCC和四方氧化锆基材。实验结果表明,基底对厚膜应变计的性能具有重要影响,这不仅是由于材料中的化学和微观结构相互作用,还因为基底和电阻器的热机械和机械性能。另一方面,厚膜应变计的构造决定了应用的敏感性。有限元分析(FEA)被用作改善结构的一种方法。为了在即将推出的厚膜应变仪的不同应用(负载传感器,压力传感器等)的设计中应用适当的特性,开发了模拟FEM(有限元法)模型。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号