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OBSERVATION OF CURRENT GAIN COLLAPSE IN LARGE-AREA HBT WITH RECTANGULAR EMITTER AND ETCHED BASE

机译:带矩形发射极和蚀刻底座的大面积HBT电流增益崩溃的观察

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摘要

We observe for the first time the current gain collapse in a large-area heterojunction bipolar transistor (HBT) with a rectangular emitter and an etched base when the HBT is operated under high power density. The collapse manifests itself by a distinct abrupt decrease of collector current in the common-emitter current-voltage characteristics. In this study, we demonstrated this unwanted phenomenon by comparing the common-emitter characteristics of the same device measured by Tektronics-577 curve tracer and HP-4145B semiconductor analyzer, respectively.
机译:我们首次观察到当HBT在高功率密度下工作时,具有矩形发射极和蚀刻基极的大面积异质结双极晶体管(HBT)中的电流增益崩溃。崩溃通过共射极电流-电压特性中集电极电流的急剧下降而表现出来。在这项研究中,我们通过比较分别由Tektronics-577曲线跟踪仪和HP-4145B半导体分析仪测得的同一器件的共发射极特性,证明了这种不良现象。

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