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A Proposed High-k Dielectric Based Thin Film Transistor for Next Generation Backplane Display Technology

机译:一种用于下一代背板显示技术的基于高k电介质的薄膜晶体管

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摘要

A Zinc oxide (ZnO)-based thin film transistor (TFT) has been proposed to be built using a high-k LaxTa1-xOy as an insulator to enhance their effectuation for backplane display technology. The device has been scrutinized on Silvaco ATLAS™ 2D simulator to examine the switching performance of the device for possible application in display driver circuits. To improvise the working of the TFT for the targeted application the atomic compositions of La and Ta in LaxTa1-xOy have been converted to attune the dielectric constant of the insulator. The study reveals that the high-k insulator-based ZnO TFT can be modified to obtain high on/off current ratio of the order of 108 to ensure the high-speed operation with low sub-threshold swing 0.49 V/dec which is desirable for low power applications. It has been demonstrated that high-k dielectric insulator-based ZnO TFT has great potential for the development of cost-effective large-area display systems.
机译:已经提出使用高k LaxTa1-xOy作为绝缘体来构建基于氧化锌(ZnO)的薄膜晶体管(TFT),以增强其对背板显示技术的作用。该设备已在Silvaco ATLAS™2D模拟器上进行了仔细检查,以检查设备的开关性能,以可能在显示驱动器电路中应用。为了改善目标应用的TFT的工作效率,LaxTa1-xOy中的La和Ta的原子组成已被转换以调节绝缘子的介电常数。研究表明,可以修改基于高k绝缘体的ZnO TFT,以获得108数量级的高开/关电流比,以确保以亚阈值摆幅低0.49 V / dec的高速运行,这对于低功耗应用。已经证明,基于高k电介质绝缘体的ZnO TFT具有开发具有成本效益的大面积显示系统的巨大潜力。

著录项

  • 来源
  • 会议地点 Kalyani(IN)
  • 作者单位

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

    Department of ECE, Motilal Nehru National Institute of Technology, Allahabad, UP, 211004, India;

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

    Department of ECE, School of Engineering Technology, Mizoram University, Aizawl, India;

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

    Dept. of Electronics Engineering, Indian Institute of Technology (Banaras Hindu University), Varanasi, 221005, India;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Zinc oxide; II-VI semiconductor materials; Thin film transistors; Logic gates; Insulators; Dielectric constant;

    机译:氧化锌; II-VI半导体材料;薄膜晶体管;逻辑门;绝缘体;介电常数;;

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