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Disordering of InGaAs/GaAs strained quantum well structures induced by rare gas ion implantation

机译:稀有气体离子注入引起的InGaAs / GaAs应变量子阱结构失序

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摘要

Abstract: In this work we have investigated the effect of various implantation schemes on In(0.2)GaAs/GaAs/AlGaAs Single Quantum Well, where the implanted species are Argon and Helium, with doses in the range 1E12 to 1E14 at cm, at energy spanning 270 - 400 KeV and 30 to 50 KeV for Ar and He, respectively. Repetitive annealing processes were carried out between 735 and 870$DGR@C and the interdiffusion was deduced by photoluminescence measurements. A maximum of 20 nm shift from He ion implanted Quantum Well with an high degree of reconstruction has been recorded, thus allowing the application of this disordering scheme for the realization of optoelectronic devices.!12
机译:摘要:在这项工作中,我们研究了各种注入方案对In(0.2)GaAs / GaAs / AlGaAs单量子阱的影响,其中注入的物种为Ar和He,剂量范围为1E12到1E14 cm Ar和He的跨度分别为270-400 KeV和30至50 KeV。在735-870 $ DGR @ C之间进行了重复退火过程,并通过光致发光测量推导了相互扩散。记录到从氦离子注入的量子阱中最大可偏移20 nm,并且具有高度的重构性,因此可以将该无序方案应用到光电器件的实现中!12

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