Determination of figure of merit (FOM) of Ti-doped sa

摘要

Abstract: A new method for measuring the figure of merit of Ti-dopes sapphire crystals is proposed in this paper. Its operating principle and measuring method are presented. The measuring accuracy has been greatly improved by means of the double- light path structures and the light incoming the crystal surface with Brewster angle. The measuring system has the advantages of simple construction and easy operation. The transmissivity measuring accuracy for Ti-doped sapphire crystal with length of 20 approximately 30 mm is about $POM 0.005. The measuring range for figure of merit is 100 approximately 150 and the measuring results have a good repeatability.!10