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Phenomenological Modeling of Surface Roughness for Predicting Reflection From Targets

机译:用于预测目标反射的表面粗糙度的现象学建模

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摘要

Exact wave theories of specular reflectance from rough surfaces are computationally intractable thus motivating the practical need for geometric reflectance models which treat only the geometric ray nature of light reflection. The cornerstone of geometric reflectance modeling from rough surfaces in computer vision and computer graphics over the past two decades has been the Torrance-Sparrow model. This model has worked well as an intuitive description of rough surfaces as a collection of planar Fresnel reflectors called microfacets together with the concept of geometric attenuation for light which is obscured during reflection under an assumed rough surface geometry. Experimental data and analysis show that the current conceptualization of how specularly reflected light rays geometrically interact with rough surfaces needs to be seriously revised. The Torrance-Sparrow model while in qualitative agreement with specular reflection from rough surfaces is seen to be quantitatively inaccurate. Furthermore there are conceptual inconsistencies upon which derivation of this reflectance model is based. We show how significant quantitative improvement can be achieved for a geometric reflectance model by making some fundamental revisions to notions of microfacet probability distributions and geometric attenuation. Work is currently undergoing, to relate physical surface reconstructions from Atomic Force Microscope data to reflectance data from these same surfaces.
机译:来自粗糙表面的镜面反射率的精确波动理论在计算上是棘手的,因此激发了对仅处理光反射的几何射线性质的几何反射率模型的实际需求。在过去的二十年中,从计算机视觉和计算机图形中的粗糙表面进行几何反射建模的基础一直是Torrance-Sparrow模型。该模型作为粗糙表面的直观描述非常有效,它被称为微刻面的平面菲涅尔反射器的集合,以及在假定的粗糙表面几何结构下反射过程中被遮挡的光的几何衰减的概念。实验数据和分析表明,镜面反射光线与粗糙表面几何相互作用的当前概念需要认真修改。在与粗糙表面的镜面反射定性一致的同时,Torrance-Sparrow模型在数量上是不准确的。此外,此反射率模型的推导基于概念上的不一致。我们展示了如何通过对微面概率分布和几何衰减的概念进行一些基本修订来实现几何反射模型的显着定量改进。当前正在开展工作,以将来自原子力显微镜数据的物理表面重建与来自这些相同表面的反射率数据相关联。

著录项

  • 来源
    《》|2007年|656602.1-656602.13|共13页
  • 会议地点 OrlandoFL(US)
  • 作者

    Lawrence B. Wolff;

  • 作者单位

    Equinox Corporation 9 West 57th Street New York, New York 10019;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 模式识别与装置;
  • 关键词

  • 入库时间 2022-08-26 14:30:53

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