Research on the Methods of Decreasing False Alarms for Mechantronic Equipments BIT (MEBIT)

摘要

Built-in test (BIT) technique is an important approach to improve testability and diagnostic capability of equipments and devices greatly. The domain of BIT application has extended from electronic equipments to mechantronic equipments. However, false alarms in mechantronic equipments BIT (MEBIT) have greatly restrained the application of BIT in mechantronic equipments. False alarms in MEBIT are more complex and difficult to cope with than in electronic equipments BIT. The paper reviews research development of false alarms, and introduces several methods in practice and aspects of theory research of decreasing false alarms at present. This paper suggests a novel idea decreasing MEBIT false alarms. The ideas consider the cause of false alarms is the hierarchy of three layers based on the test and diagnosis process of MEBIT. Aim at the cause, artificial intelligence and nonlinear theory for example neural network, information fusion and rough set are suggested to apply to the three layer of MEBIT and some ideas and methods to decrease false alarms are proposed in this paper. In next research work, the ideas and methods will be validated.