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SIMS Analysis the Distributions of Heavy Metals and Major Elements in the Heavy Metals Polluted Agricultual Soil

机译:SIMS分析重金属污染农业土壤中重金属和主要元素的分布

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摘要

Background and Aims:The soil heavy metals pollution is a hot research field in recent years,but the in situ analysis the distributions of elements in the soil is very scanty.Secondary ion mass spectrometry (SIMS) is a highly sensitive surface analytical technique that is capable of detecting and mapping dements at the parts per million level with sub-micron resolution (Pacholski and Wigogard,1999).The SIMS has been applied in material science,geology and cosmochemistry,biology,but recently,it also expand into soil science (Herrmann et al.,2007;K(o)gel-Knabner et al.,2010).
机译:背景与目的:土壤重金属污染是近年来研究的热点,但就地分析土壤中元素的分布却很少。二次离子质谱(SIMS)是一种高灵敏度的表面分析技术,能够以亚微米级的分辨率检测和绘制百万分之几的沉积物(Pacholski and Wigogard,1999)。SIMS已应用于材料科学,地质学和宇宙化学,生物学,但最近也扩展到土壤科学( Herrmann等人,2007; K(o)gel-Knabner等人,2010)。

著录项

  • 来源
  • 会议地点 Tianjin(CN)
  • 作者单位

    Key Laboratory of Surficial Geochemistry,Ministry of Education,School of Earth Sciences and Engineering,Nanjing University,Nanjing 210093,China;

    Key Laboratory of Surficial Geochemistry,Ministry of Education,School of Earth Sciences and Engineering,Nanjing University,Nanjing 210093,China;

    College of Resource and Environmental Science,Nanjing Agricultural University,210095 Nanjing,China;

    Department of Terrestrial Magnetism,Carnegie Institution of Washington,Washington,DC,USA;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 污染生态学;
  • 关键词

    heavy metal; soil; secondary ion mass spectrometry; pollution; imaging;

    机译:重金属;泥;二次离子质谱污染;影像学;
  • 入库时间 2022-08-26 14:02:18

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