Experimental study for method to measure terminal part temperature of micro-electronic devices using infrared thermograph and image processing

摘要

Concerning surface mount resistors, which are one of micro electronic devices, measurement of the terminal part temperature measurement is important from the standpoint of thermal management. When the electronic device designer uses the infrared thermograph to measure the approximate value of the terminal part temperature of the surface mount resistor, the surface hotspot of the resistor will form a so striking contrast in the thermograph image that the terminal part will be hard to be measured. The possible method for overcoming this problem is to apply a proper cutoff frequency filter to the obtained temperature distribution image, and then smooth the hotspot of the resistor (locally high temperature portion of resister surface) down near the terminal part temperature level, and finally read this hotspot temperature as the terminal part temperature. The possibility mentioned above will be discussed in this study.