Dept. of Micro Nanosystem Technol., HBV-Buskerud Vestfold Univ. Coll., Borre, Norway;
brittle fracture; chemical interdiffusion; copper alloys; diffusion bonding; ductile fracture; gold alloys; indium alloys; shear strength; solders; thermal stability; tin alloys; Au-In; Au-Sn; Cu-Sn; MIL-STD requirement; SLID bonds; brittle fracture mode; ductile fracture mode; high-temperature shear strength; high-temperature stability; intermetallics; mechanical strength; normal solder temperatures; shear strength testing; solid-liquid interdiffusion bonding technique; temperature 293 K to 298 K; temperature 300 degC; t;
机译:晶圆级Cu-Sn固液互扩散(SLID)键的空隙形成和键强度的研究
机译:Au-In系统中的固液互扩散(SLID)键合:实验研究和一维建模
机译:温度对Au-Sn SLID键的模切强度的影响
机译:固液间隔(滑动)粘合剂的高温剪切强度:Cu-Sn,Au-Sn和Au-In
机译:碳化硅与钢的固液互扩散键合,用于高温MEMS传感器的包装和键合。
机译:使用Al-Ni中间层的p型方钴矿热电材料的固液互扩散(SLID)键
机译:au-sn sLID键合:可靠的HT互连和芯片连接技术