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High-temperature shear strength of solid-liquid interdiffusion (SLID) bonding: Cu-Sn, Au-Sn and Au-In

机译:固液互扩散(SLID)键的高温剪切强度:Cu-Sn,Au-Sn和Au-In

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Solid-Liquid Interdiffusion (SLID) bonding is a promising bonding technique, particularly for high-temperature applications. Based on intermetallics as the bonding medium, the bonds are stable at temperatures far above the processing temperature which is in the range of normal solder temperatures. This work confirms experimentally this high-temperature stability through shear strength testing as function of temperature (room temperature to 300 °C) for three different SLID systems: Cu-Sn, Au-Sn and Au-In. All three systems remain solid within the tested temperature range, as expected, but they show remarkably different temperature dependence of mechanical strength: Au-Sn SLID bonds show strongly decreasing shear strength with temperature (but at 300 °C it is still well above the MIL-STD requirement); Cu-Sn SLID bonds show only small changes; whereas Au-In SLID bonds show increased shear strength at 300 °C, accompanied with a change in fracture mode from brittle to ductile. All three behaviours can be explained from the phase diagrams with the actual phases in use.
机译:固液互扩散(SLID)键合是一种很有前途的键合技术,特别是在高温应用中。基于金属间化合物作为键合介质,键合在远高于正常焊接温度范围内的加工温度的温度下稳定。通过对三种不同的SLID系统(Cu-Sn,Au-Sn和Au-In)的剪切强度测试,该工作通过温度(室温至300°C)的函数,通过实验确定了这种高温稳定性。正如预期的那样,所有三个系统在测试的温度范围内均保持固态,但它们显示出机械强度对温度的显着不同:Au-Sn SLID键显示出随温度而显着降低的剪切强度(但在300°C时仍远高于MIL -STD要求); Cu-Sn SLID键仅显示很小的变化;而Au-In SLID键在300°C时显示出增加的剪切强度,并伴随着断裂模式从脆性到延性的变化。可以从相图中解释使用实际阶段的所有三种行为。

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