首页> 外文会议>2011 International Symposium on Advanced Packaging Materials >Adhesion evaluation of the heat resistant pressure sensitive adhesives at elevated temperatures for MEMS gyroscope testing
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Adhesion evaluation of the heat resistant pressure sensitive adhesives at elevated temperatures for MEMS gyroscope testing

机译:高温下用于MEMS陀螺仪测试的耐热压敏胶的粘合力评估

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摘要

Due to the requirement of high throughput, functional testing of MEMS gyroscopes should be performed on wafer level while the wafers are still on the carrier tape. In addition, it is often required that the functional characterization is carried out also at elevated temperatures, up to 150 °C. The fact that comprehensive characterization of gyroscopes can take tens of minutes sets stringent requirements for the tapes where they are mounted. In this work the applicability of five different commercial back-grinding tapes of Si wafers were evaluated based on the following criteria: thermal stability, change in adhesion with increase in temperature, and the amount of residues on peeled surfaces. The adhesion on three surfaces (polished silicon, polymer, and brushed steel) was measured and evaluated in terms of adhesion strength and adhesion work. The adhesive polymer on all five base films was modified acrylic with different compositions of additives and the base film was ethylene vinyl acetate, polyethylene terephthalate, or polyolefin. Two of the tapes were UV curable. Four of five tapes passed the thermal stability test without noticeable changes in appearance. The adhesion strength was measured by employing the tensile test (T: 80, 100, 125 and 150 °C; t: 0.5, 1, and 1.5 h) and the adhesion work was determined based on the stressstrain measurements. The results were analysed by the Analysis of Variance and Bonferroni all-pairwise mean comparison test. The following conclusions were made: /') the surface material affects adhesion significantly, ii) the non-UV tapes can sustain elevated temperatures better than the UV tapes, iii) as the temperature was increased the adhesion of all tapes increased until about 100 °C, after which it decreased notably with further increase in temperature, iv) the adhesion remained stable for about 60 minutes after which a decrease in adhesion was recorded. The detachment work and the amount of residue showed strong correlation as they are both dependent on the amount of adhesive fibrillations formed during detachment.
机译:由于高吞吐量的要求,MEMS陀螺仪的功能测试应在晶圆仍在载带上的同时在晶圆级进行。另外,经常需要在高达150℃的高温下也进行功能表征。陀螺仪的全面表征可能需要数十分钟的事实,对安装它们的磁带提出了严格的要求。在这项工作中,根据以下标准评估了五种不同的商用硅晶片背面研磨带的适用性:热稳定性,随温度升高的粘合力变化以及剥离表面上的残留物数量。测量并评估了三个表面(抛光硅,聚合物和拉丝钢)的粘附力,并根据粘附强度和粘附功进行了评估。所有五个基膜上的粘合剂聚合物都是改性丙烯酸,具有不同的添加剂组成,基膜是乙烯乙酸乙烯酯,聚对苯二甲酸乙二醇酯或聚烯烃。其中两个胶带是可紫外线固化的。五分之四的胶带通过了热稳定性测试,外观没有明显变化。通过采用拉伸试验(T:80、100、125和150℃; t:0.5、1和1.5h)测量粘合强度,并基于应力应变测量确定粘合功。通过方差分析和Bonferroni全对均值比较检验对结果进行分析。得出以下结论:/')表面材料显着影响粘附力; ii)非紫外线胶带比紫外线胶带能更好地承受高温; iii)随着温度的升高,所有胶带的附着力都提高到约100° C,其随温度的进一步升高而显着降低,iv)粘合力保持稳定约60分钟,此后记录到粘合力下降。分离工作和残留物的量显示出很强的相关性,因为它们都取决于分离过程中形成的粘合剂原纤化的量。

著录项

  • 来源
  • 会议地点 Xiamen(CN)
  • 作者单位

    Aalto University School of Electrical Engineering Department of Electronics P.O. Box 13340, F1N-00076, Aalto;

    Aalto University School of Electrical Engineering Department of Electronics P.O. Box 13340, F1N-00076, Aalto;

    Aalto University School of Electrical Engineering Department of Electronics P.O. Box 13340, F1N-00076, Aalto;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 TN405.94;
  • 关键词

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