首页> 外文会议>2003 International Electronic Packaging Technical Conference and Exhibition; Jul 6-11, 2003; Maui, Hawaii >EFFECT OF NI COATING OVER CU BALL ON THE MICROSTRUCTURE OF FLIP CHIP JOINTS WITH CU-CORED SOLDER BALLS
【24h】

EFFECT OF NI COATING OVER CU BALL ON THE MICROSTRUCTURE OF FLIP CHIP JOINTS WITH CU-CORED SOLDER BALLS

机译:镀镍在铜球上对带有铜芯焊球的倒装芯片接头组织的影响

获取原文
获取原文并翻译 | 示例

摘要

Effect of Ni coating over the Cu core of Cu-cored Sn-5mass%Ag balls was investigated on the microstructures of flip chip joints with Ni/Au plated Cu pads after reflow soldering and the subsequent heat exposure at 423 K. For joints using Cu-cored Sn-5Ag balls with Ni coating over the Cu core, a Ni-Sn reaction layer forms at the Cu core/Sn-5Ag interface. A similar Ni-Sn reaction layer forms at the interface between the Sn-5Ag solder and the Ni/Au plated Cu pad. Although the Ni-Sn reaction layers grow with increasing the thermal exposure time, the growth rate is slower than that of a Cu-Sn reaction layer formed at the Cu core/Sn-5Ag interface in the joint with the Cu-cored Sn-5Ag ball without Ni coating over the Cu core.
机译:研究了在回流焊接后以及随后在423 K下热暴露后,覆有Cu的Sn-5mass%Ag球的Cu芯上的Ni覆层对带有Ni / Au镀Cu焊盘的倒装芯片接头的微观结构的影响。对于使用Cu的接头在Cu核上覆有Ni的Sn-5Ag芯球中,在Cu核/ Sn-5Ag界面处形成Ni-Sn反应层。在Sn-5Ag焊料和镀Ni / Au的Cu垫之间的界面上会形成类似的Ni-Sn反应层。尽管Ni-Sn反应层随着热暴露时间的增加而生长,但其生长速率却慢于与Cu-Sn-5Ag结合的Cu core / Sn-5Ag界面处形成的Cu-Sn反应层。铜芯上没有镀镍的钢球。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号