New Test Architecture of Flash Memory testing

摘要

Three new architectures that applied to flash memory test are introduced in this article. Test Per- Site Architecture allows each device to run through the test flow as fast as possible without waiting for operations on other DUTs to improve the throughput, while Multiple DUT test enhance throughput via resource sharing. If the test architecture can reduce the TTO, the Multiple DUT/Site Architecture can consider as the most efficient test architecture to enable test cost reduction.