首页> 外国专利> Flicker measuring device, flicker measuring method, flicker measurement program, flicker evaluation support device, flicker evaluation support method and flicker evaluation support program

Flicker measuring device, flicker measuring method, flicker measurement program, flicker evaluation support device, flicker evaluation support method and flicker evaluation support program

机译:闪烁测量装置,闪烁测量方法,闪烁测量程序,闪烁评估支持设备,闪烁评估支持方法和闪烁评估支持计划

摘要

Flicker measuring deviceBased on the amount of measurement of the measurement object obtained from the measurement object under the condition of flickerFor the first processing of calculating the flicker value of each of the plurality of measurement regions set in the measurement objectA first processing unit to be executed for each of a plurality of measurement conditions prestored in a measurement condition storage partData consisting of flicker values of the plurality of measurement regions calculated by the first processing unit andMeasuring conditions andFor the second process of generating string data with a stringA second processing unit to be executed for each of the plurality of measurement conditions andThe string data generated by the second processing unitFor the third processing to be stored in the string data storage unitA third processing unit to be executed for each of the plurality of measurement conditions and.
机译:在Fleicker的条件下从测量对象获得的测量对象的测量量的闪烁测量磁通量测量在测量对象第一处理单元中设置的多个测量区域中的每一个的闪烁值的第一处理 在测量条件存储部分中预先保存的多个测量条件中的每一个由由第一处理单元和模拟条件计算的多个测量区域的闪烁值组成,并且对于使用要执行的字符串第二处理单元生成串数据的第二处理 多个测量条件中的每一个和由第二处理单元生成的第三处理生成的串数据以存储在串数据存储单元中的第三处理单元中以用于多个测量条件中的每一个执行。

著录项

  • 公开/公告号JPWO2020079946A1

    专利类型

  • 公开/公告日2021-09-16

    原文格式PDF

  • 申请/专利权人 コニカミノルタ株式会社;

    申请/专利号JP20200552551

  • 发明设计人 今井 克樹;

    申请日2019-08-20

  • 分类号G01J1/44;H04N5/232;

  • 国家 JP

  • 入库时间 2022-08-24 21:06:17

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