首页> 外国专利> Metrology for organic light emitting diode fabrication using photoluminescence spectroscopy

Metrology for organic light emitting diode fabrication using photoluminescence spectroscopy

机译:用于使用光致发光光谱法的有机发光二极管制造的计量

摘要

An apparatus for identifying the characteristics of a photoluminescence (PL) layerA light source that generates excitation light including light from visible or near visible spectrumAn optical assembly configured to guide excitation light on a pl layerThe PL radiation is generated by the PL layer in response to the excitation light interacting with the PL layer.Detectors configured to generate signals based on PL radiationAndA computer device connected to a detector;Signal received from the detectorIncludes a computational device configured to identify the PL layer characteristics based on the signal.Diagram
机译:一种装置,用于识别产生包括来自可见光或近可见光谱光学组件的励磁光的光致发光(PL)层光源的特性,所述光谱光谱组件被配置为在PL层上引导PL层上的PL辐射产生的PL辐射响应于 激励光与P1层交互。被配置为基于连接到检测器的PL辐射和谐的计算机设备生成信号的数据;从检测器接收的信号被配置为基于信号来识别PL层特征.diagram

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号