首页> 外国专利> METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATING DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

METHOD FOR EVALUATING STRUCTURE USED FOR NUCLIDE TRANSMUTATION REACTION, EVALUATING DEVICE, STRUCTURE MANUFACTURING DEVICE PROVIDED WITH SAME, AND NUCLIDE TRANSMUTATION SYSTEM

机译:用于评估用于核素嬗变反应的结构的方法,评估装置,具有相同的结构制造装置和核素嬗变系统

摘要

The object of the present invention is to provide an evaluation method and an evaluation device for nondestructively evaluating the soundness of a structure to be used for nuclide transmutation. The present invention relates to a method for evaluating a structure, the structure (1) including a base material (2) containing at least one kind of metal selected from the group consisting of hydrogen storage metals and hydrogen storage alloys, an intermediate layer (3) provided on the base material (2) and stacked alternately with a first layer containing low work function substances relatively lower in work function than the metal and a second layer containing the metal, and a surface layer (4) provided on the intermediate layer (3) and containing the metal, wherein the method includes measuring a change in polarization between incident light and reflected light by irradiating the surface layer (4) with light, while holding the structure (1) at a predetermined temperature, and comparing a measurement value of the change in polarization with a threshold of a change in polarization of a structure prepared in advance and evaluating a soundness of the structure (1) based on comparison results.
机译:发明内容本发明的目的是提供一种评估方法和用于非破坏性评估用于核素嬗变的结构的声度的评估方法和评估装置。本发明涉及一种用于评估结构的方法,该结构(1)包括含有至少一种选自储氢金属和储氢合金的金属的基材(2),所述结构(1)包括储氢金属和储氢合金,中间层(3 )在基材(2)上,与在工作功能中相对较低的含有低功函数物质的第一层交替地堆叠,而不是含有金属的第二层,以及设置在中间层上的表面层(4)( 3)并含有金属,其中该方法包括通过用光照射表面层(4),在预定温度下保持所述结构(1)并比较测量值来测量入射光和反射光之间的偏振之间的变化。具有预先准备的结构的偏振的变化的偏振阈值的变化,并基于比较评价结构(1)的声音结果。

著录项

  • 公开/公告号EP3584802B1

    专利类型

  • 公开/公告日2021-03-03

    原文格式PDF

  • 申请/专利权人 MITSUBISHI HEAVY INDUSTRIES LTD.;

    申请/专利号EP20180780695

  • 发明设计人 TSURUGA SHIGENORI;

    申请日2018-04-03

  • 分类号G21G7;G01N21/01;G01N21/21;G21G1/10;

  • 国家 EP

  • 入库时间 2022-08-24 17:28:57

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