首页> 外国专利> Address free fault location in PCM system - uses closed loop digital test system evaluating bit failures over repeated cycles

Address free fault location in PCM system - uses closed loop digital test system evaluating bit failures over repeated cycles

机译:PCM系统中无地址的故障定位-使用闭环数字测试系统评估重复周期中的位故障

摘要

The address free fault location system is for use with the transmission of digital, in particular PCM, signals over distances requiring intermediate repeating stations (ZWR1 to ZWRn). The transmission (OS) includes a closed loop digital signal (PF11 to PFin) and test signals that can be analysed by the receiver (OE). The intermediate stations can send signals both ways. The loop closed signal in a digital HDBn or mBnT code only becomes operative after a number of repeated cycles and evaluation for bit failures and signal delay time.
机译:无地址故障定位系统用于在需要中间中继站(ZWR1至ZWRn)的距离上传输数字信号,尤其是PCM信号。传输(OS)包括一个闭环数字信号(PF11至PFin)和可以由接收器(OE)分析的测试信号。中间站可以双向发送信号。数字HDBn或mBnT代码中的闭环信号仅在经过多次重复循环并评估位故障和信号延迟时间后才可操作。

著录项

  • 公开/公告号DE2653178A1

    专利类型

  • 公开/公告日1978-05-24

    原文格式PDF

  • 申请/专利权人 SIEMENS AG;

    申请/专利号DE19762653178

  • 发明设计人 POSPISCHILREGINHARDDR.-ING.;

    申请日1976-11-23

  • 分类号H04L25/00;H03K13/01;H04L25/04;

  • 国家 DE

  • 入库时间 2022-08-22 21:59:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号