SYSTEM FOR REMOVING AND PROCESSING INTERFERENCE SPECTRUM OF MIXED MATERIAL IN SPECTROCHEMICAL ANALYZING APPARATUS

摘要

PURPOSE:To measure the concn. of a trace of mixed material with high sensitivity and in a short time by removing the influence of the interferential spectrum from the measured spectrum, and obtaining the concn. of the target material with high sensitivity. CONSTITUTION:A semiconductor laser 5 is driven by a sweep controlling part 6 and sweeps in order the scattered wave number positions. On the other hand, light emitted from the laser 5 passes through a sample by a light passage length LX and absorbed with respect to a sample cell 7. Light emitted from the cell 7 is divided to two parts by a semitransparent mirror 10, one is passed through a photoelectric converter 11, and the other through the target material in a reference cell 12 by a light passage length LR, respectively and inputted to a converter 13. Data of a sample spectrum SX and a reference spectrum SR are formed from respective output signals from the converters 11, 13. Further, a concn. calculating part 21 calculates an accompanying spectrum S*, and obtains a concn. CX in the sample of the target material by using respective data of SX, SR, W, LR, CR, LX, etc.