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METHOD OF ELECTRON DIFFRACTOMETRIC INVESTIGATION, OF PHASE TRANSITION KINETICS IN THIN FILMS

机译:薄膜中电子相变研究的相变动力学研究

摘要

the essence of the u0438u0437u043eu0431u0440u0435u0442u0435u043du0438u00a0: the researched object are heated in u044du043bu0435u043au0442u0440u043eu043du043eu0433u0440u0430u0444u0435 and recorded one of his lines u0434u0438u0444u0440u0430u043au0446u0438u043eu043du043du043eu0433u043e spectrum wide open aperture. the width of the slits to exceed the width of the line with its displacement in the process of u043du0430u0433u0440u0435u0432u0430.2 il.
机译:u0438 u0437 u043e u0431 u0440 u0435 u0442 u0435 u043d u0438 u00a0的本质:所研究的对象在 u044d u043b u0435 u043a u0442 u0440 u043e u043d u043a u043e u0433 u0440 u0430 u0444 u0435并记录了他的其中一行 u0434 u0438 u0444 u0440 u0430 u043a u0446 u0438 u043e u043d u043d u043e u043e u0433 u043e光谱宽开口孔径。在 u043d u0430 u0433 u0440 u0435 u0432 u0430.2的过程中,缝隙的宽度超过其线的宽度。

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