首页> 外国专利> RELIABILITY EVALUATING METHOD AND RELIABILITY EVALUATING DEVICE FOR MULTILAYER PRINTED WIRING BOARD AND PROBE FOR INTERLAYER RESISTANCE MEASUREMENT FOR MULTILAYER WIRING BOARD

RELIABILITY EVALUATING METHOD AND RELIABILITY EVALUATING DEVICE FOR MULTILAYER PRINTED WIRING BOARD AND PROBE FOR INTERLAYER RESISTANCE MEASUREMENT FOR MULTILAYER WIRING BOARD

机译:多层印刷线路板的可靠性评估方法和可靠性评估装置以及多层线路板的层间电阻测量探针

摘要

PROBLEM TO BE SOLVED: To provide a reliability evaluating method and a reliability evaluating device for a multilayer printed wiring board and a probe for interlayer resistance measurement for a multilayer wiring board, making it possible to make sure of a value of individual insulation resistance of each layer by a simple structure. SOLUTION: A plurality of electrodes L1 to L8 are exposedly provided on a top-layer board surface, respective patterns on plurally layered printed circuit boards including a printed circuit board Pw1 are connected to the electrodes L1 to L8 via through holes TH2 to TH8, respectively, and the electrodes L1 to L8 are connected in series with each other by exposed connection parts Cn12 to Cn78. By this method, when any of the respective connection parts is not cut off, all the patterns are connected with each other, and therefore, reliability evaluation of the whole is made at a stroke by measuring an insulation resistance value or continuity, and then, reliability evaluation between desired patterns is separately performed by measuring an insulation resistance value or continuity after a desired connection part is successively cut off.
机译:解决的问题:提供用于多层印刷线路板的可靠性评估方法和可靠性评估装置以及用于多层线路板的层间电阻测量的探针,使得可以确保每个绝缘电阻的值。通过简单的结构层。解决方案:多个电极L1至L8暴露在顶层板表面上,包括印刷电路板Pw1在内的多层印刷电路板上的各个图形分别通过通孔TH2至TH8连接到电极L1至L8。电极L1至L8通过暴露的连接部Cn12至Cn78彼此串联连接。通过该方法,当没有切断各个连接部中的任何一个时,所有的图案彼此连接,因此,通过测量绝缘电阻值或连续性,整体上进行可靠性评估,然后,在依次切断期望的连接部之后,通过测量绝缘电阻值或导通性来分别执行期望的图案之间的可靠性评估。

著录项

  • 公开/公告号JP2000035453A

    专利类型

  • 公开/公告日2000-02-02

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP19980201029

  • 发明设计人 KAI IKUYO;

    申请日1998-07-16

  • 分类号G01R31/00;G01R31/02;H05K3/46;

  • 国家 JP

  • 入库时间 2022-08-22 01:58:43

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号