首页> 外国专利> OPTICAL PHASE CONTROLLER FOR PHASE SHIFT INTERFEROMETER FOR PLANE MEASUREMENT AND OPTICAL PHASE CONTROL METHOD FOR THE SAME, AND STORAGE MEDIUM WITH OPTICAL PHASE CONTROL PROGRAM

OPTICAL PHASE CONTROLLER FOR PHASE SHIFT INTERFEROMETER FOR PLANE MEASUREMENT AND OPTICAL PHASE CONTROL METHOD FOR THE SAME, AND STORAGE MEDIUM WITH OPTICAL PHASE CONTROL PROGRAM

机译:用于平面测量的相移干涉仪的光学相位控制器及其相同的光学相位控制方法,以及具有光学相位控制程序的存储介质

摘要

PROBLEM TO BE SOLVED: To provide the optical phase controller and method of a phase shift interferometer for plane measurement for operating highly accurate phase shift, without using special devices and a storage medium storing an optical phase control program.;SOLUTION: A phase for minimizing a difference value between the maximum value and a minimum value for the brightness intensity of the mutual pixels of an interference fringe picture (image I) at a phase 0 and an interference fringe image (second image IIA), obtained by shifting the phase of the first picture is obtained. Thus, interference fringe images can be obtained at the phase 0 and a phase 180, and to obtain an interference fringe image at a phase 90 by calculating the intermediate position of the center of gravity position of the interference fringes of the interference fringe images, and to obtain the phase shape of an object 1 to be measured by operating plane analysis based on the three interference fringe image.;COPYRIGHT: (C)2001,JPO
机译:要解决的问题:提供一种用于平面测量的光学相移干涉仪和方法,该光学相移干涉仪用于进行高精度的相移,而无需使用专用设备和存储光学相控程序的存储介质。通过偏移相位的相位而获得的干涉条纹图片(图像I)在相位0和干涉条纹图像(第二图像IIA)的相互像素的亮度强度的最大值和最小值之间的差值。获得第一张照片。因此,可以在相位0和相位180处获得干涉条纹图像,并且通过计算干涉条纹图像的干涉条纹的重心位置的中间位置来获得相位90处的干涉条纹图像,并且基于三个干涉条纹图像,通过工作面分析获得待测物体1的相位形状。版权所有:(C)2001,JPO

著录项

  • 公开/公告号JP2001174213A

    专利类型

  • 公开/公告日2001-06-29

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP19990360733

  • 发明设计人 HANDA HIROHISA;MITSUYA NAOKI;

    申请日1999-12-20

  • 分类号G01B9/02;G01B11/24;G01J9/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:30:14

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