首页> 外国专利> Interferometric measurements, such as used in holographic, shear and speckle interferometry, made using liquid crystal polymers to provide shutter effects by changing their properties to vary the light that can pass through them

Interferometric measurements, such as used in holographic, shear and speckle interferometry, made using liquid crystal polymers to provide shutter effects by changing their properties to vary the light that can pass through them

机译:干涉测量,例如在全息,剪切和散斑干涉测量中使用的测量,使用液晶聚合物通过改变其特性以改变可通过它们的光而提供快门效果

摘要

Method and device for regular illumination of objects for interferometric measurements in which liquid crystal polymers are placed in the beam path of the light source. The LC-Ps are used to adjust the intensity of light passing through them from a zero value up to a maximum value. Use of LC-Ps with CCD detectors enables the sampling frequency of the camera to be optimized in conjunction with the operation of the LC-Ps.
机译:用于定期测量物体以进行干涉测量的方法和装置,其中将液晶聚合物放置在光源的光路中。 LC-P用于将通过它们的光强度从零值调整到最大值。将LC-P与CCD检测器配合使用,可以结合LC-P的操作来优化摄像机的采样频率。

著录项

  • 公开/公告号DE10053024A1

    专利类型

  • 公开/公告日2002-05-08

    原文格式PDF

  • 申请/专利权人 STEINCHEN WOLFGANG;

    申请/专利号DE2000153024

  • 申请日2000-10-26

  • 分类号G01B9/02;H04N1/00;G02F1/13;G03B9/02;G01B11/00;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:26

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