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METHOD FOR GROWING NITRIDE-BASED SEMICONDUCTOR CRYSTAL TO GROW HIGH-QUALITY NITRIDE SEMICONDUCTOR THIN FILM AND USE SUCH THIN FILM AS MATERIAL OF LIGHT EMITTING DEVICE REQUIRING HIGH BRIGHTNESS AND HIGH RELIABILITY
METHOD FOR GROWING NITRIDE-BASED SEMICONDUCTOR CRYSTAL TO GROW HIGH-QUALITY NITRIDE SEMICONDUCTOR THIN FILM AND USE SUCH THIN FILM AS MATERIAL OF LIGHT EMITTING DEVICE REQUIRING HIGH BRIGHTNESS AND HIGH RELIABILITY
PURPOSE: A method for growing a nitride-based semiconductor crystal is provided to grow a high-quality nitride semiconductor thin film and use such a thin film as a material of a light emitting device requiring high brightness and high reliability by using a SiC layer as a buffer layer. CONSTITUTION: A SiC thin film of a predetermined thickness on a sapphire substrate(11) is used as a buffer layer(12). An InAlGaN-based thin film is grown on the buffer layer. The thickness(t) of the SiC thin film used as the buffer layer is 0.5 nanometer=t=500 nanometer. CBr4 and/or CxHy(x,y are integers) are used as a carbon precursor. The growth temperature(T) of the SiC buffer layer is 300 deg.C=T=1500 deg.C.
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机译:用途:提供一种生长氮化物基半导体晶体的方法,以生长高质量的氮化物半导体薄膜,并通过使用SiC层作为薄膜来使用这种薄膜作为需要高亮度和高可靠性的发光器件的材料。缓冲层。组成:在蓝宝石衬底(11)上预定厚度的SiC薄膜用作缓冲层(12)。在缓冲层上生长基于InAlGaN的薄膜。用作缓冲层的SiC薄膜的厚度(t)为0.5纳米≤t≤500纳米。 CBr 4和/或C x H y(x,y是整数)被用作碳前体。 SiC缓冲层的生长温度(T)为300℃≤T≤1500℃。
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