首页> 外国专利> METHOD FOR GROWING NITRIDE-BASED SEMICONDUCTOR CRYSTAL TO GROW HIGH-QUALITY NITRIDE SEMICONDUCTOR THIN FILM AND USE SUCH THIN FILM AS MATERIAL OF LIGHT EMITTING DEVICE REQUIRING HIGH BRIGHTNESS AND HIGH RELIABILITY

METHOD FOR GROWING NITRIDE-BASED SEMICONDUCTOR CRYSTAL TO GROW HIGH-QUALITY NITRIDE SEMICONDUCTOR THIN FILM AND USE SUCH THIN FILM AS MATERIAL OF LIGHT EMITTING DEVICE REQUIRING HIGH BRIGHTNESS AND HIGH RELIABILITY

机译:生长基于氮化物的半导体晶体以生长高质量的氮化物半导体薄膜并将这种薄膜用作需要高亮度和高可靠性的发光器件的方法

摘要

PURPOSE: A method for growing a nitride-based semiconductor crystal is provided to grow a high-quality nitride semiconductor thin film and use such a thin film as a material of a light emitting device requiring high brightness and high reliability by using a SiC layer as a buffer layer. CONSTITUTION: A SiC thin film of a predetermined thickness on a sapphire substrate(11) is used as a buffer layer(12). An InAlGaN-based thin film is grown on the buffer layer. The thickness(t) of the SiC thin film used as the buffer layer is 0.5 nanometer=t=500 nanometer. CBr4 and/or CxHy(x,y are integers) are used as a carbon precursor. The growth temperature(T) of the SiC buffer layer is 300 deg.C=T=1500 deg.C.
机译:用途:提供一种生长氮化物基半导体晶体的方法,以生长高质量的氮化物半导体薄膜,并通过使用SiC层作为薄膜来使用这种薄膜作为需要高亮度和高可靠性的发光器件的材料。缓冲层。组成:在蓝宝石衬底(11)上预定厚度的SiC薄膜用作缓冲层(12)。在缓冲层上生长基于InAlGaN的薄膜。用作缓冲层的SiC薄膜的厚度(t)为0.5纳米≤t≤500纳米。 CBr 4和/或C x H y(x,y是整数)被用作碳前体。 SiC缓冲层的生长温度(T)为300℃≤T≤1500℃。

著录项

  • 公开/公告号KR20050014345A

    专利类型

  • 公开/公告日2005-02-07

    原文格式PDF

  • 申请/专利权人 EPIVALLEY CO. LTD.;

    申请/专利号KR20030052936

  • 发明设计人 JANG MOON SIK;

    申请日2003-07-30

  • 分类号H01L33/00;

  • 国家 KR

  • 入库时间 2022-08-21 22:05:52

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