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Integrated circuit having a programmable gate array and a field programmable gate array and methods of designing and manufacturing the same using testing IC before configuring FPGA

机译:具有可编程门阵列和现场可编程门阵列的集成电路及其在配置FPGA之前使用测试IC进行设计和制造的方法

摘要

The present invention provides an integrated circuit (IC). In one embodiment, the IC includes a substrate and a plurality of gate array blocks located on the substrate. Each of the blocks includes a programmable gate array (PGA) containing at least a portion of a circuit design in an interconnect layer thereof, and a field-programmable gate array (FPGA) coupled to the PGA and capable of containing a configuration that augments the portion of the circuit design. In this embodiment, the PGA and the FPGA cooperate to effect the circuit design. In another aspect, the present invention provides a method of designing an IC. In yet another aspect, the present invention provides a method of manufacturing ICs.
机译:本发明提供了一种集成电路(IC)。在一实施例中,IC包括衬底和位于衬底上的多个门阵列块。每个模块包括一个可编程门阵列(PGA)和一个现场可编程门阵列(FPGA),该可编程门阵列(PGA)在其互连层中至少包含一部分电路设计,该现场可编程门阵列(FPGA)与PGA耦合,并且能够包含增强该配置的配置。电路设计的一部分。在该实施例中,PGA和FPGA协作以实现电路设计。在另一方面,本发明提供一种设计IC的方法。在另一方面,本发明提供一种制造IC的方法。

著录项

  • 公开/公告号US7024641B1

    专利类型

  • 公开/公告日2006-04-04

    原文格式PDF

  • 申请/专利权人 DANIEL R. WATKINS;

    申请/专利号US20020119821

  • 发明设计人 DANIEL R. WATKINS;

    申请日2002-04-10

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 21:40:37

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