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test that can determine the leakage current due to the particle size and particle generation patterns

机译:可以确定由于颗粒大小和颗粒产生方式而引起的泄漏电流的测试

摘要

particles (particle) caused by leakage current and to determine the particle size of the test pattern can (test pattern) provides . According to one aspect of the invention there is provided a plurality of contacts to be introduced when the test pad (pad) of , and electrically connected to each of the pads , and is introduced to the particles to be separated from each other , if the lead particles are introduced between the mutual by including a test pattern for leakage current measurement, spaced interval between measurement patterns present a different interval of check for leakage current test pattern in accordance with the pad .
机译:粒子(粒子)引起的泄漏电流并确定可以由测试图案(测试图案)提供的粒度。根据本发明的一个方面,提供了多个触点,当所述多个触点的测试垫(焊盘)被电连接到每个焊盘时被引入,并且被引入到要彼此分离的粒子上,如果通过包括用于泄漏电流测量的测试图案,将铅颗粒引入相互之间,测量图案之间的间隔呈现出与焊盘不同的检查泄漏电流测试图案的间隔。

著录项

  • 公开/公告号KR100571393B1

    专利类型

  • 公开/公告日2006-04-14

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20030098338

  • 发明设计人 오민재;

    申请日2003-12-27

  • 分类号H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 21:23:56

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