A method for carrying out a bit error rates tests and bit error rates test system

摘要

A method for carrying out a bit error rates tests to be tested on a device (104), wherein the method comprises repeating a test process up to its conclusion, the stochastic comprises the steps of:(a) measuring a plurality of bits, which are to be tested by the device (104) are output, in order to identify bit errors;(b) determining the cumulative number of bit errors (r), in all of the passes of the step (a) have been identified;(c) calculating a of cumulation distribution function (pcdfs) of a bit error rate on the basis of the cumulative number of bit errors;(d) determining whether the pcdf is greater than or equal to a desired probability of (c) is that the bit error rate of the device to be tested (104) is less than a bit error rates test limit (l) is;(e) if the pcdf is greater than or equal to c, determining that the test has been passed, and the end of the test process;(f) if the pcdf not greater than or equal to c, determining whether 1 - pcdf is greater than or equal to c is;..