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Metal oxide semiconductor field effect transistor, comprises drift zone having sub zone arranged between another sub zone and body zone, and drift zone is doped more strongly than sub zone

机译:金属氧化物半导体场效应晶体管,包括漂移区,该漂移区具有布置在另一个子区和主体区之间的子区,并且该漂移区比该子区更强地掺杂。

摘要

The transistor comprises a semiconductor body (1) with multiple source electrode (31,32,33,34), which is designed with transistor cells in a successive drain zone (10) of a conduction type (n) in a vertical direction. The drift zone has a sub zone (21), which is arranged between another sub zone and the body zone (30), and is doped more strongly than the sub zone (22). The drift zone has another sub zone (23) for the formation of an edge termination between the sub zone and the lateral edge (13) of the semiconductor body, which is doped weaker than the sub zone and it has a larger dimension. Independent claims are also included for the following: (1) a method for the production of an edge termination of a semiconductor body, involves producing of a semiconductor layer by the conduction type (2) a method for the production of an edge termination of a semiconductor body, involves producing of a semiconductor layer by the conduction type, which is more weakly doped than the substrate.
机译:该晶体管包括具有多个源电极(31、32、33、34)的半导体本体(1),该源电极被设计为在垂直方向上在导电类型(n)的连续漏极区(10)中具有晶体管单元。漂移区具有子区(21),其布置在另一个子区与主体区(30)之间,并且比子区(22)更强地掺杂。漂移区具有另一个子区(23),用于在子区和半导体本体的侧向边缘(13)之间形成边缘终端,其掺杂程度比子区弱,并且具有较大的尺寸。还包括以下独立权利要求:(1)一种用于制造半导体本体的边缘终端的方法,包括通过导电类型来制造半导体层(2)一种用于制造半导体本体的边缘终端的方法。半导体本体涉及通过导电类型来制造半导体层,该导电层比衬底更弱地掺杂。

著录项

  • 公开/公告号DE102006007096A1

    专利类型

  • 公开/公告日2007-08-30

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AUSTRIA AG;

    申请/专利号DE20061007096

  • 发明设计人 SIEMIENIEC RALF;SCHULZE HANS-JOACHIM;

    申请日2006-02-15

  • 分类号H01L29/78;H01L29/06;H01L21/336;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:27

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