首页> 外国专利> METHOD FOR PROCESSING GROUP III NITRIDE SEMICONDUCTOR, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE, GROUP III NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, AND GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT

METHOD FOR PROCESSING GROUP III NITRIDE SEMICONDUCTOR, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE, GROUP III NITRIDE SEMICONDUCTOR LIGHT EMITTING DEVICE, METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT, AND GROUP III NITRIDE SEMICONDUCTOR LASER ELEMENT

机译:III族氮化物半导体的制造方法,III族氮化物半导体发光器件的制造方法,III族氮化物半导体发光器件,III族氮化物半导体激光元件的制造方法以及III族氮化物半导体

摘要

PROBLEM TO BE SOLVED: To provide a method for processing a group III nitride semiconductor that can process a group III nitride semiconductor with high precision and at high speed without damaging its surface.;SOLUTION: In a chlorine-containing gas atmosphere under the atmospheric pressure or under a pressure near the atmospheric pressure, plasma is generated by a radical supply section 2 at a location away from a single-crystal GaN substrate 6 as a processed object, thus generating radical. The substrate 6 is heated up to a temperature equal to or higher than the boiling temperature of chloride of a group III element (Ga) contained in the substrate 6, and at the same time, the radical generated in plasma of a plasma generator (electrode section 81) is brought into contact with the surface of the substrate 6, thereby processing its surface.;COPYRIGHT: (C)2009,JPO&INPIT
机译:要解决的问题:提供一种用于处理III族氮化物半导体的方法,该方法可以高精度且高速地处理III族氮化物半导体而不会损坏其表面。;解决方案:在大气压下的含氯气体气氛中或在接近大气压的压力下,在远离作为处理对象的单晶GaN衬底6的位置处由自由基供给部2产生等离子体,从而产生自由基。将基板6加热到等于或高于基板6中包含的III族元素(Ga)的氯化物的沸腾温度的温度,并且同时,在等离子体产生器(电极)的等离子体中产生的自由基部分81)与基材6的表面接触,从而对其表面进行处理。;版权所有:(C)2009,JPO&INPIT

著录项

  • 公开/公告号JP2008251893A

    专利类型

  • 公开/公告日2008-10-16

    原文格式PDF

  • 申请/专利权人 SHARP CORP;MORI YUZO;

    申请/专利号JP20070092253

  • 发明设计人 KANETSUKI RITSUO;MORI YUZO;

    申请日2007-03-30

  • 分类号H01L21/3065;H01S5/02;H01L33;

  • 国家 JP

  • 入库时间 2022-08-21 20:24:58

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