首页> 外国专利> POSITION CORRECTION COEFFICIENT CALCULATING METHOD OF CHARGED PARTICLE BEAM DRAWING APPARATUS, AND POSITION CORRECTION COEFFICIENT UPDATING METHOD OF CHARGED PARTICLE BEAM DRAWING APPARATUS

POSITION CORRECTION COEFFICIENT CALCULATING METHOD OF CHARGED PARTICLE BEAM DRAWING APPARATUS, AND POSITION CORRECTION COEFFICIENT UPDATING METHOD OF CHARGED PARTICLE BEAM DRAWING APPARATUS

机译:带电粒子束抽出装置的位置校正系数更新方法及带电粒子束抽出装置的位置校正系数更新方法

摘要

PROBLEM TO BE SOLVED: To provide a method for reducing a time to be taken for calculating a correction efficient, and to provide a method for updating the correction coefficient.;SOLUTION: The position correction coefficient calculating method of an electron beam drawing apparatus, which is one mode of calculating a coefficient of an approximate expression for correcting a misregistration due to a structure of the electron beam drawing apparatus, comprises the scan step of scanning a plurality of marks arranged regularly in an overall region equivalent to a drawing region of a sample to be drawn on a stage by use of charged particle beams (S102); and the coefficient calculating step of fitting a misregistration amount of each mark scanned in a coordinate system of the drawing apparatus to calculate the coefficient of the approximate expression fitted (S104).;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:提供一种减少用于计算校正效率的时间的方法,并且提供一种用于更新校正系数的方法。解决方案:电子束描绘装置的位置校正系数计算方法,该方法是一种计算近似表达式的系数以校正由于电子束绘图设备的结构引起的配准不良的方式,包括扫描步骤,该扫描步骤扫描在与样本的绘图区域等效的整个区域中规则排列的多个标记通过使用带电粒子束在舞台上绘制(S102); ;系数计算步骤:拟合在绘图设备的坐标系中扫描的每个标记的未对准量,以计算拟合的近似表达式的系数(S104)。版权所有:(C)2008,JPO&INPIT

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