Generate noise simulated measuring device and generate noise simulated measurement method of electronic substrate

摘要

PROBLEM TO BE SOLVED: To provide the simple generation noise simulated measurement method of an electronic substrate with an integrated circuit element loaded, for improving measurement precision.;SOLUTION: Before executing an equivalence measurement means 140 of a generation noise, a virtual electronic substrate corresponding to an electronic substrate to be measured is generated on an electronic computer by a setting storage means 200a of an equivalent load circuit corresponding to an integrated circuit element, a setting storage means 300a of an equivalent noise source and a selection and extraction storage means 500 of substrate design CAD data. The initial adjustment of the setting storage means 300a of the equivalent noise source is performed so that the virtual load current can be almost equal to the measurement value of noise currents by a basic experiment measurement means 300b, and the initial adjustment of a simulated measurement gain is performed by an antenna characteristic calibration means 400a. Thus, it is possible to achieve simple simulated measurement by an equivalent circuit system, and to improve measurement precision by double initial adjustment.;COPYRIGHT: (C)2007,JPO&INPIT