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RELIABLE WAFER-LEVEL CHIP-SCALE PACKAGE SOLDER BUMP STRUCTURE IN A PACKAGED SEMICONDUCTOR DEVICE

机译:封装半导体器件中可靠的晶圆级芯片级封装焊料凸点结构

摘要

A wafer level chip scale package (WLCSP) includes a packaged semiconductor device with a plurality of solder bump pads, patterned passivation regions above each of the solder bump pads, a patterned under bump metallization (UBM) region on each of the solder bump pads and the passivation regions, a polyimide region over a portion of the UBM regions and the passivation regions, solder bumps formed on each of the UBM regions, and encapsulation material surrounding the semiconductor die except for at least a portion of each of the solder bumps.
机译:晶圆级芯片规模封装(WLCSP)包括具有多个焊料凸块焊盘的封装半导体器件,每个焊料凸块焊盘上方的图案化钝化区域,每个焊料凸块焊盘上的图案化的凸块下金属化(UBM)区域和钝化区域,在一部分UBM区域和钝化区域上的聚酰亚胺区域,在每个UBM区域上形成的焊料凸点,以及除了每个焊料凸点的至少一部分之外的围绕半导体管芯的封装材料。

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