Technique for detecting corruption associated with a stack in a storage device

摘要

A technique for detecting corruption associated with a stack in a storage device is disclosed. In one embodiment, the technique is realized by having a processing device insert a quantity of information adjacent to the stack in the storage device, wherein the quantity of information has an initial state. The processing device then inspects the quantity of information so as to identify any deviation from the initial state and thereby detect corruption associated with the stack in the storage device.