首页> 外国专利> Production of silicon porous particles for the application of active substances, comprises doping an area of a silicon wafer, producing recesses in the silicon wafer, porosifying of the silicon wafer, and removing of the porous particles

Production of silicon porous particles for the application of active substances, comprises doping an area of a silicon wafer, producing recesses in the silicon wafer, porosifying of the silicon wafer, and removing of the porous particles

机译:用于施加活性物质的硅多孔颗粒的生产包括:掺杂硅晶片的区域;在硅晶片中产生凹槽;对硅晶片进行孔隙化;以及去除多孔颗粒。

摘要

The production of silicon porous particles for the application of active substances, comprises doping an area (2) of a p-doped silicon wafer (1), producing recesses (3) in the silicon wafer, porosifying of the silicon wafer, functionalizing of the porous particles, and removing of the porous particles by mechanical effect. An area enclosed by the recesses forms the lateral dimensions of the porous particle. The area that is near to a surface is doped with a layer thickness of 500 nm to 5 mu m. Stabilizing elements are present in the structure of recesses. The production of silicon porous particles for the application of active substances, comprises doping an area (2) of a p-doped silicon wafer (1), producing recesses (3) in the silicon wafer, porosifying of the silicon wafer, functionalizing of the porous particles, and removing of the porous particles by mechanical effect. An area enclosed by the recesses forms the lateral dimensions of the porous particle. The area that is near to a surface is doped with a layer thickness of 500 nm to 5 mu m. Stabilizing elements are present in the structure of recesses. Below the doped area forming the porous particle, an area with higher porosity or area with local electro polishing is formed opposite to the doped area. Non-porosified area is formed below the porous particle formed in the doped area. An independent claim is included for silicon porous particles.
机译:用于施加活性物质的硅多孔颗粒的生产包括:掺杂p掺杂硅片(1)的区域(2);在硅片中产生凹槽(3);对硅片进行多孔化处理;对硅片进行功能化多孔颗粒,并通过机械作用除去多孔颗粒。由凹槽包围的区域形成了多孔颗粒的横向尺寸。靠近表面的区域掺杂有500 nm至5μm的层厚度。在凹槽的结构中存在稳定元件。用于施加活性物质的硅多孔颗粒的生产包括:掺杂p掺杂硅片(1)的区域(2);在硅片中产生凹槽(3);硅片的孔隙化;硅片的功能化多孔颗粒,并通过机械作用除去多孔颗粒。由凹槽包围的区域形成了多孔颗粒的横向尺寸。靠近表面的区域掺杂有500 nm至5μm的层厚度。在凹槽的结构中存在稳定元件。在形成多孔颗粒的掺杂区域下方,与掺杂区域相对地形成具有较高孔隙率的区域或具有局部电抛光的区域。在掺杂区域中形成的多孔粒子的下方形成非多孔化区域。对于硅多孔颗粒包括独立权利要求。

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