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SUBSTRATE TRANSFER SYSTEM CAPABLE OF SPEEDY WAFER MAPPING, CAPABLE OF PREVENTING AN ERROR IN MAPPING A WAFER

机译:能够进行恶意晶圆映射的基板传输系统,能够防止映射晶圆中的错误

摘要

PURPOSE: A substrate transfer system is provided to improve mapping speed by mapping a plurality of wafers thorough a plurality of mapping sensor at the same time.;CONSTITUTION: A substrate housing is loaded in a load port. A plurality of mapping sensor bars(310) are included in the rear side of a door holder of the door opener opening/ closing the door of the substrate housing. The mapping sensor bars corresponds to the number of the semiconductor substrates which are settled on a slot in the substrate housing. A wafer mapping member maps a plurality of semiconductor substrates through a detection sensor(320). The detection sensor is attached to one end of mapping sensor bars.;COPYRIGHT KIPO 2010
机译:目的:提供一种基板传送系统,以通过同时通过多个测绘传感器对多个晶片进行测绘来提高测绘速度。组成:将基板壳体加载到装载端口中。在打开/关闭基板壳体的门的开门器的门保持器的后侧中包括多个映射传感器条(310)。映射传感器条对应于安置在基板壳体中的狭槽上的半导体基板的数量。晶片映射构件通过检测传感器(320)映射多个半导体衬底。检测传感器安装在测绘传感器条的一端。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100054554A

    专利类型

  • 公开/公告日2010-05-25

    原文格式PDF

  • 申请/专利权人 SEMES CO. LTD.;

    申请/专利号KR20080113517

  • 发明设计人 KIM JIN HWAN;

    申请日2008-11-14

  • 分类号H01L21/68;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:44

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