首页> 外国专利> SEMICONDUCTOR DEVICE HAVING THE SILICON PENETRATING VIA STRUCTURE, CAPABLE OF OBTAINING THE VOLTAGE MARGIN AND THE TIMING MARGIN

SEMICONDUCTOR DEVICE HAVING THE SILICON PENETRATING VIA STRUCTURE, CAPABLE OF OBTAINING THE VOLTAGE MARGIN AND THE TIMING MARGIN

机译:具有通过结构渗透硅的半导体器件,能够获得电压裕度和时序裕度

摘要

PURPOSE: A semiconductor device having the silicon penetrating via structure is provided to alleviate the capacitive effect of TSV structure by using the ohmic contact.;CONSTITUTION: A chip penetrating via(TSV) is inserted into the semiconductor wafer. An insulation layer is arranged around the chip penetration via to separate the semiconductor wafer and the chip penetration via. The ohmic contact layer is arranged in order to surround the chip penetration via on the surface part of the semiconductor wafer. The connection wiring electrically connects the chip penetration via and the ohmic contact layer.;COPYRIGHT KIPO 2011
机译:目的:提供一种具有硅穿透通孔结构的半导体器件,以通过使用欧姆接触来减轻TSV结构的电容效应。;组成:将芯片穿透通孔(TSV)插入半导体晶片中。在芯片穿透通孔周围布置绝缘层以分离半导体晶片和芯片穿透通孔。布置欧姆接触层以便在半导体晶片的表面部分上围绕芯片穿透通孔。连接线将芯片穿透孔和欧姆接触层电连接。; COPYRIGHT KIPO 2011

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