首页> 外国专利> MCCL FOR LOT TEST OF WITHSTANDING VOLTAGE, METHOD OF LOT TEST WITHSTANDING VOLTAGE BY USING THE SAME AND MANUFACTURING METHOD OF NORMAL DISCRIMINATED MCCL

MCCL FOR LOT TEST OF WITHSTANDING VOLTAGE, METHOD OF LOT TEST WITHSTANDING VOLTAGE BY USING THE SAME AND MANUFACTURING METHOD OF NORMAL DISCRIMINATED MCCL

机译:额定电压批量测试的MCCL,使用正常判别MCCL的相同方法和批量制造方法的额定电压测试

摘要

PURPOSE: A metal copper clad laminate(MCCL) for a complete voltage withstanding test, a method for the complete voltage withstanding test of the MCCL using the same, and a method for manufacturing verified copper clad laminate are provided to prevent the occurrence of safety accidents a conductive foreign material is remained in the insulator of the MCCL. CONSTITUTION: An MCCL(100) is laminated structure of a metal plate(110), an insulator(120), and a first copper foil(130). The end of the first copper foil is spaced apart from the end of the insulator. If a conductive foreign material is remained in the insulator, the breakdown of an insulating layer is occurred. If the breakdown of the insulating layer is occurred, the MCCL is verified as a bad unit.
机译:目的:提供用于完全耐压测试的金属覆铜层压板(MCCL),使用其进行MCCL的完全耐压测试的方法,以及用于制造经验证的覆铜层压板以防止发生安全事故的方法。导电异物残留在MCCL的绝缘体中。组成:MCCL(100)是金属板(110),绝缘体(120)和第一铜箔(130)的叠层结构。第一铜箔的端部与绝缘体的端部间隔开。如果导电异物残留在绝缘体中,则会发生绝缘层的击穿。如果发生绝缘层击穿,则将MCCL确认为不良单元。

著录项

  • 公开/公告号KR101017468B1

    专利类型

  • 公开/公告日2011-02-25

    原文格式PDF

  • 申请/专利权人 SEJONG METAL CO. LTD.;

    申请/专利号KR20100091759

  • 发明设计人 LEE SANG WON;

    申请日2010-09-17

  • 分类号H05K13/08;H05K1/09;B32B15/01;

  • 国家 KR

  • 入库时间 2022-08-21 17:50:34

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号