ACTIVATED PATH EXTRACTION PROGRAM, ACTIVATED PATH EXTRACTION DEVICE, AND ACTIVATED PATH EXTRACTION METHOD

摘要

PROBLEM TO BE SOLVED: To quickly extract an activated path through which a signal propagates in the case of the delay test of an actual chip.;SOLUTION: This activated path extraction device includes: a simulation part 11 for specifying a signal value change pin whose signal value has changed in the case of a delay test by performing the simulation of the delay test on the basis of a test pattern in the case of the delay test and the net list of an actual chip; and a path trace part 12 for tracing the activated path by following the signal value change pin on the basis of the signal value change pin specified by the simulation part 11 and the net list of the actual chip.;COPYRIGHT: (C)2012,JPO&INPIT